What’s New in NIS-Elements 3.2
NIS-Elements Version 3.20 introduces a new release of features to facilitate your custom experiments and evolving protocols.
Nikon Instruments’ commitment to continually enhance and elevate the performance of widefield and confocal microscope systems is bolstered through aggressive software design and development. Version 3.20 continues to merge unique features for emerging applications resulting from an influential collaborative interaction with our customer base in the research and industrial market.
Version 3.20 is recognized for numerous customizable options, combining popular techniques such as EDF and HDR, Large Image Scanning and Z Capture and more tools for total flexibility for device control:
New Core Features
- New Customizable Control Panel
- New Customizable Optical Configuration Panel
- New Customizable Options for Microsoft Excel Export
- New Simple Industrial Interface for Documentation Package
Acquisition Controls
- New Custom Acquisition
- New Optical Configuration Flexibility Including Pseudocolor
- New Optical Configuration Options for Dual Cameras
- Intensity Correction through Z
- Scan Large Image and Z
- Combining Real Time EDF and High Dynamic Range
- Chroma Filter Database in Device Control Database
- Stage Movement through Object Catalog
- Removal of Stage Positions During Experiment
- Enhancements to Multidimensional Large Image
New Presentation & Processing Tools
- 3D Crop in Volume View
- Display Z Depth in Volume View
- Movie Maker Presets and LUT options
Analysis and Measurement Capability
- New Binary Labeling and Coloring
- New ROI Editing Tools Over Time
- Time Measurement Speed Increase
